Publications

Book Chapters

  1. Kazutoshi Kobayashi, Mahfuzul Islam, Takashi Matsumoto, and Ryo Kishida, Chapter Title: “Random Telegraph Noise Under Switching Operation,” Book Title: “Noise in Nanoscale Semiconductor Devices,” Springer, 2020.
  2. Mahfuzul Islam, and Hidetoshi Onodera, Chapter Title: “Monitor Circuits for Cross-Layer Resiliency,” Book Title: “Dependable Embedded Systems,” Springer, 2020.

Journal Papers

  1. Takehiro Kitamura, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, “Design and Optimization of Order Statistics Based Flash ADC Using Multiple Comparator Groups,” IEEE Transactions on Circuits and Systems I: Regular Papers, under review.
  2. Daiki Tashiro, Kana Sameshima, Takashi Hisakado, A.K.M. Mahfuzul Islam, and Osami Wada, “Single-Conductor Transmission-Line Model for Bent Wire Structures,” IEEE Transactions on Electromagnetic Compatability, under review.
  3. Shinichi Oota, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, “Wide-range and low supply dependency MOSFET-based temperature sensing utilizing statistical properties of scaled MOSFETs,” Japanese Journal of Applied Physics, accepted. (DOI: 10.35848/1347-4065/acb94e)
  4. Mahfuzul Islam, Shogo Harada, Takashi Hisakado, and Osami Wada, “Threshold Voltage Difference Based CMOS Temperature Sensor with Statistical MOSFET Selection,” IEEE Access, under review.
  5. Misaki Udo, Mahfuzul Islam, and Hidetoshi Onodera, “Comparison of RTN-induced Delay Variability under Supply and Back-gate Voltage Tuning via Trap Activation Mechanism,” IEEE Transactions on Semiconductor Manufacturing, under review.
  6. Kenta Yamamoto, Takashi Hisakado, Mahfuzul Islam, and Osami Wada, “Global Stabilization for Nonlinear Two-Port Characteristics of Bidirectional DC/DC Converter and Its Application to Peer-to-Peer Energy Transfer,” Nonlinear Theory and Its Applications, IEICE, Vol.E14-N, No.2, pp.-, Apr. 2023.
  7. Shun Yamaguchi, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, “Low-Power Design of Digital LDO With Non-linear Symmetric Frequency Generation,” IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 69, no. 12, pp. 4644-4648, Dec. 2022. (DOI: 10.1109/TCSII.2022.3184774) [PDF]
  8. Takehiro Kitamura, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, “Order statistics based low-power flash ADC with on-chip comparator selection,” IEICE Transactions on Fundamentals, Vol. E105-A, No. 11, pp. 1450-1457, Nov. 2022. [PDF]
  9. Mahfuzul Islam, and Shogo Harada, “On-chip leakage current variation measurement using external-reference-free current-to-time conversion for densely placed MOSFETs,” Japanese Journal of Applied Physics, vol. 61, pp. SC1056, 2022. [PDF]
  10. Teruki Someya, A.K.M. Mahfuzul Islam, and Kenichi Okada, “A 6.4 nW 1.7% Relative Inaccuracy CMOS Temperature Sensor Utilizing Sub-thermal Drain Voltage Stabilization and Frequency Locked Loop,” IEEE Solid-State Circuits Letter, vol. 3, pp. 458-461, 2020. [PDF]
  11. Teruki Someya, A.K.M. Mahfuzul Islam, Takayasu Sakurai, and Makoto Takamiya, “An 11-nW CMOS Temperature-to-Digital Converter Utilizing Sub-Threshold Current at Sub-Thermal Drain Voltage,” IEEE Journal of Solid-State Circuits, vol. 54, no. 3, pp. 613-622, March 2019. [PDF]
  12. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “Circuit Techniques for Device-Circuit Interaction toward Minimum Energy Operation.” IPSJ Transactions on System LSI Design Methodology, vol. 12, pp. 2-12, 2019. [PDF]
  13. Swapnil Sayan Saha, Shafizur Rahman, Miftahul Jannat Rasna, Tarek Bin Zahid, A.K.M. Mahfuzul Islam, and Md. Atiqur Rahman Ahad, “Feature Extraction, Performance Analysis and System Design using the DU Mobility Dataset,” IEEE Access, vol. 6, pp. 44776-44786, 2018. [PDF]
  14. A. K. M. Mahfuzul Islam, Tatsuya Nakai, and Hidetoshi Onodera, “Statistical Analysis and Modeling of Random Telegraph Noise Based on Gate Delay Measurement,” IEEE Transactions on Semiconductor Manufacturing, vol. 30, no. 3, pp. 216-226, 2017. [PDF]
  15. A. K. M. Mahfuzul Islam, M. Hamamatsu, T. Yokota, S. Lee, W. Yukita, M. Takamiya, T. Someya, and T. Sakurai, “Programmable Neuron Array Based on a 2-Transistor Multiplier Using Organic Floating-Gate for Intelligent Sensors,” IEEE Journal on Emerging and Selected Topics in Circuits and Systems, vol. 7, no. 1, pp. 81-91, March 2017. [PDF]
  16. A.K.M. Mahfuzul Islam, Jun Shiomi, Tohru Ishihara, and Hidetoshi Onodera, “Wide-Supply-Range All-Digital Leakage Variation Sensor for On-chip Process and Temperature Monitoring,” IEEE Journal of Solid-State Circuits, vol. 50, no. 11, pp. 2475-2490, 2015. [PDF]
  17. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “Area-efficient Reconfigurable Ring Oscillator for Characterization of Static and Dynamic Variations,” Japanese Journal of Applied Physics, vol. 53, no. 4S, pp. 04EE08, 2014. [PDF]
  18. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation,” IEICE Transactions on Information and Systems, vol. E96-D, no. 9, pp. 1971-1979, 2013. [PDF]
  19. Shuuichi Fujimoto, A.K.M. Mahfuzul Islam, Takashi Matsumoto, and Hidetoshi Onodera, “Inhomogeneous Ring Oscillator for Within-Die Variability and RTN Characterization,” IEEE Transactions on Semiconductor Manufacturing, vol. 26, no. 3, pp. 296-305, 2013. [PDF]
  20. A.K.M. Mahfuzul Islam, Akira Tsuchiya, Kazutoshi Kobayashi, and Hidetoshi Onodera, “Variation-sensitive Monitor Circuits for Estimation of Global Process Parameter Variation,” IEEE Transactions on Semiconductor Manufacturing, vol. 25, no. 4, pp. 571-580, 2012. [PDF]

Conference/Workshop Proceedings

  1. Raul Roberto Rodriguez Gutierrez, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, “Real-time temperature estimation of SiC MOSFETs using gate voltage at zero-current switching for inverter applications,” in IEEE International Conference on Power Electronics-ECCE Asia, May 2023, to appear.
  2. Yuma Iwata, Takehiro Kitamura, and Mahfuzul Islam, “Measurement of temperature effect on comparator offset voltage variation,” in IEEE International Conference on Microelectronic Test Structures, March 2023, to appear.
  3. Mahfuzul Islam, Takehiro Kitamura, Takashi Hisakado, Osami Wada, “Demonstration of order statistics based Flash ADC in a 65nm process,” in 28th Asia and South Pacific Design Automation Conference, January 2023, pp. 188-189.
  4. Shun Yamaguchi, Mahfuzul Islam, Takashi Hisakado, Osami Wada, “A fully synchronous digital LDO with built-in adaptive frequency modulation and implicit dead-zone control,” in 28th Asia and South Pacific Design Automation Conference, January 2023, pp. 186-187. (Best Design Award)
  5. Kenta Yamamoto, Takashi Hisakado, Mahfuzul Islam, Osami Wada, “Global Stabilization for Nonlinear Two-Port Characteristics of Bidirectional DC/DC Converter,” NOLTA 2022, Opatija, Croatia (Online), December 2022.
  6. Shinichi Ota, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, “Wide temperature- and voltage-range temperature sensing utilizing statistical property of sub-threshold MOSFET current,” in International Conference on Solid State Devices and Materials, September 2022, pp. 788-789.
  7. Takehiro Kitamura, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, “Performance Improvement of Order Statistics Based Flash ADC Using Multiple Comparator Groups,” in IEEE International NEWCAS Conference, June 2022, pp. 1-4. (Invited to IEEE-CAS special edition)
  8. Misaki Udo, Mahfuzul Islam, and Hidetoshi Onodera, “Homogeneous ring oscillator with staggered layout for gate-level delay characterization,” in IEEE International Microelectronic Test Structures (ICMTS), March 2022, to appear.
  9. Shogo Harada, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, “A process scalable voltage-reference-Free temperature sensor utilizing MOSFET threshold voltage variation,” in IEEE Asian Solid-State Circuits Conference (A-SSCC), Nov. 2021, pp. 1-3.
  10. Mahfuzul Islam, and Shogo Harada, “On-chip leakage current variation measurement using reference-free current-to-time conversion,” in International Conference on Solid State Devices and Materials, Sep. 2021, pp. 694-695.
  11. Kensuke Murakami, Mahfuzul Islam, and Hidetoshi Onodera, “CDF Distance Based Statistical Parameter Extraction Using Nonlinear Delay Variation Models,” in 27th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), June 2021, pp. 1-6.
  12. Takehiro Kitamura, Mahfuzul Islam, Takashi Hisakado, and Osami Wada, “Flash ADC Utilizing Offset Voltage Variation With Order Statistics Based Comparator Selection,” in International Symposium on Quality Electronic Design (ISQED), March 2021, pp. 103-108.
  13. Teruki Someya, A.K.M. Mahfuzul Islam, and Kenichi Okada, “A 6.4nW 1.7% Relative Inaccuracy CMOS Temperature Sensor Utilizing Sub-thermal Drain Voltage Stabilization and Frequency Locked Loop,” in IEEE Asian Solid-State Circuits Conference (A-SSCC), Hiroshima, Japan, Nov. 2020.
  14. Masaki Kawamoto, Takashi Hisakado, Mahfuzul Islam, and Osami Wada, “Power Equalization of Peer-to-Peer Energy Transfer in Star Networks Using Broadcast from Reference Voltage Source,” in NOLTA 2020, Okinawa, Japan(Online), Nov. 2020.
  15. Daisuke Akimaru, Takashi Hisakado, Mahfuzul Islam, and Osami Wada, “Excitation of the Light Line Mode with Metamaterials Composed of Parallel Conductors Based On Equivalent-Circuit Model Including Retarded Electromagnetic Coupling,” in 2020 Fourteenth International Congress on Artificial Materials for Novel Wave Phenomena (Metamaterials), New York, USA(Online), Sep. 2020, pp. 291–293.
  16. Hiromu Yamasaki, Koutaro Miyazaki, Yang Lo, A. K. M. Mahfuzul Islam, Katsuhiro Hata, Takayasu Sakurai, and Makoto Takamiya, “Power Device Degradation Estimation by Machine Learning of Gate Waveforms,” in International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Kobe, Japan, Sep. 2020, pp. 335-338.
  17. Misaki Udo, Kensuke Murakami, A. K. M. Mahfuzul Islam, and Hidetoshi Onodera, “Increased Delay Variability due to Random Telegraph Noise under Dynamic Back-gate Tuning,” in IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS), May 2020, pp. 1-6.
  18. Akira Hasegawa, Takashi Hisakado, A.K.M. Mahfuzul Islam, and Osami Wada, “Topological Tuning of a Dispersion Curve by Controlling Locations of Impurities with Equivalent Circuit Model,” in International Congress on Artificial Materials for Novel Wave Phenomena (Metamaterials), pp. 149–151, Rome, Italy, September. 2019. 
  19. Nobuhiko Kawashima, Takashi Hisakado, A.K.M. Mahfuzul Islam, and Osami Wada, “Transients of Gyrator Network of Bidirectional AC/DC Converters in Peer-to-Peer Energy Transfer,” in International Symposium on Nonlinear Theory and Its Applications (NOLTA), Kuala Lumpur, Malaysia, December 2019, pp. 2-6,. 
  20. K. Miyazaki, Y. Lo, A.K.M. Mahfuzul Islam, K. Hata, M. Takamiya, and T. Sakurai, “CNN-based Approach for Estimating Degradation of Power Devices by Gate Waveform Monitoring,” in IEEE International Conference on IC Design and Technology (ICICDT), Suzhou, China, June 2019, pp. 104-107.
  21. A.K.M. Mahfuzul Islam, Ryota Shimizu, and Hidetoshi Onodera, “Analysis of Random Telegraph Noise (RTN) at Near-threshold Operation by Measuring 154k Ring Oscillators,” in IEEE International Reliability Physics Symposium (IRPS), April 2019, pp. 1-6.
  22. A.K.M. Mahfuzul Islam, Ryota Shimizu, and Hidetoshi Onodera, “Effect of Logic Depth and Switching Speed on Random Telegraph Noise Induced Delay Fluctuation,” in International Conference on Microelectronic Test Structure (ICMTS), March 2019, pp. 160-170.
  23. A.K.M. Mahfuzul Islam, Shinichi Nishizawa, Yusuke Matsui, and Yoshinobu Ichida, “Drive-Strength Selection for Synthesis of Leakage-Dominant Circuits,” in International Symposium on Quality Electronic Design (ISQED), March 2019, pp. 298-303.
  24. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “PVT2: Process, Voltage, Temperature and Time-dependent Variability in Scaled CMOS Process,” in IEEE/ACM International Conference on Computer-Aided Design, November 2018.
  25. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “Worst-case Performance Analysis Under Random Telegraph Noise Induced Threshold Voltage Variability,” in ACM International Symposium on Power and Timing Modeling, Optimization and Simulation, July 2018, pp. 140-146. [C_Islam_PATMOS_2018]
  26. Swapnil Sayan Saha, Shafizur Rahman, Miftahul Jannat Rasna, A.K.M. Mahfuzul Islam, and Md. Atiqur Rahman Ahad, “DU-MD: An Open-Source Human Action Dataset for Ubiquitous Wearable Sensors,” in 7th International Conference on Informatics, Electronics and Vision, June 2018, pp. 567-572. (Best paper nominee) [C_Saha_ICIEV_2018]
  27. Teruki Someya, A.K.M. Mahfuzul Islam, Takayasu Sakurai, and Makoto Takamiya, “A 13nW Temperature-to-Digital Converter Utilizing Sub-threshold MOSFET Operation at Sub-thermal Drain Voltage,” in Custom Integrated Circuits Conference, April 2018, pp. 1-4. (Best paper nominee) [C_Someya_CICC_2018]
  28. A.K.M. Mahfuzul Islam, Masashi Oka, and Hidetoshi Onodera, “Measurement of Temperature Effect on Random Telegraph Noise Induced Delay Fluctuation,” in International Conference on Microelectronic Test Structure, March 2018, pp. 2010-2015. [C_Islam_ICMTS_2015]
  29. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “Supply Voltage Effect on Random Telegraph Noise Induced Delay Variation,” in IEEE/ACM Workshop on Variability Modeling and Characterization, November 2017.
  30. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “Effect of Supply Voltage on Random Telegraph Noise of Transistors under Switching Condition,” in International Symposium on Power and Timing Modeling, Optimization and Simulation, September 2017,  pp. 1-8. [C_Islam_PATMOS_2017]
  31. A.K.M. Mahfuzul Islam, Tatsuya Nakai, and Hidetoshi Onodera, “A Statistical Modeling Methodology of RTN Gate Size Dependency Based on Skewed Ring Oscillators,” IEEE International Conference on Microelectronic Test Structure, March 2017, pp. 1-6. (Best paper award) [C_Islam_ICMTS_2017]
  32. A.K.M. Mahfuzul Islam, Hiroshi Fuketa, Koichi Ishida, Tomoyuki Yokota, Tsuyoshi Sekitani, Makoto Takamiya, Takao Someya, and Takayasu Sakurai, “Sensor and Circuit Solutions for Organic Flexible Electronics,” in Society for Information Display Symposium Digest of Technical Papers, May 2016, pp. 629-632. [C_Islam_SID_2016]
  33. A.K.M. Mahfuzul Islam, Tatsuya Nakai, and Hidetoshi Onodera, “Statistical Analysis and Modeling of Random Telegraph Noise Based on Gate Delay Variation Measurement,” in IEEE International Conference on Microelectronic Test Structures, March 2016, pp. 82-87. [C_Islam_ICMTS_2016]
  34. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “On-chip Monitoring and Compensation Scheme with Fine-grain Body Biasing for Robust and Energy-Efficient Operations,” in IEEE Asia and South Pacific Design Automation Conference, January 2016. pp. 403-407. [C_Islam_ASP-DAC_2016]
  35. A.K.M. Mahfuzul Islam, Tatsuya Nakai, and Hidetoshi Onodera, “Characterization of Gate Width Dependency on Random Telegraph Noise using Reconfigurable Ring Oscillator for Compact Statistical Modeling,” in IEEE/ACM Workshop on Variability Modeling and Characterization, November 2015.
  36. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “Sensitivity-Independent Extraction of Vth Variation Utilizing Log-normal Delay Distribution,” in IEEE International Conference on Microelectronic Test Structures, March 2015. pp. 212-217. [C_Islam_ICMTS_2015]
  37. Norihiro Kamae, A.K.M. Mahfuzul Islam, Akira Tsuchiya, Tohru Ishihara, and Hidetoshi Onodera, “Energy Reduction by Built-in Body Biasing with Single Supply Voltage Operation,” in 16th International Symposium on Quality Electronic Design, March 2015, pp. 181-185. [C_Kamae_ISQED_2015]
  38. A.K.M. Mahfuzul Islam, Jun Shiomi, Tohru Ishihara, and Hidetoshi Onodera, “Wide-Supply- Range All-Digital Leakage Variation Sensor for On-chip Process and Temperature Monitoring,” in IEEE Asian Solid-State Circuits Conference, November 2014, pp. 45-48. (Invited to IEEE-JSSC special edition) [C_Islam_A-SSCC_2014]
  39. Norihiro Kamae, A.K.M. Mahfuzul Islam, Akira Tsuchiya, Tohru Ishihara, and Hidetoshi Onodera, “Body Bias Generator with Wide Supply-Range Down to Threshold Voltage for Within-Die Variability Compensation,” in IEEE Asian Solid-State Circuits Conference, November 2014, pp. 53-56. [C_Kamae_A-SSCC_2014]
  40. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “Characterization and Compensation of Performance Variability Using On-chip Monitors,” in IEEE International Symposium on VLSI Design, Automation and Test, April 2014. (Invited) [C_Islam_VLSI-DAT_2014]
  41. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “In-Situ Variability Characterization of Individual Transistors using Topology-Reconfigurable Ring Oscillators,” in IEEE International Conference on Microelectronic Test Structures, March 2014, pp. 121-126. [C_Islam_ICMTS_2014]
  42. Norihiro Kamae, A.K.M Mahfuzul Islam, Akira Tsuchiya, and Hidetoshi Onodera, “Cell-based Physical Design Automation for Analog and Mixed Signal Application,” in ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems, March 2014.
  43. A.K.M. Mahfuzul Islam, Tohru Ishihara, and Hidetoshi Onodera, “Reconfigurable Delay Cell for Area-efficient Implementation of On-chip MOSFET Monitor Schemes,” in IEEE Asian Solid-State Circuits Conference, November 2013, pp. 125-128. (Student design contest award) (Invited to IEEE-JSSC special edition) [C_Islam_A-SSCC_2013]
  44. A.K.M. Mahfuzul Islam, Norihiro Kamae, Tohru Ishihara, and Hidetoshi Onodera, “Energy-efficient Dynamic Voltage and Frequency Scaling by P/N-performance Self-adjustment using Adaptive Body Bias,” in Proceedings of SASIMI, October 2013.
  45. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “Area-efficient Reconfigurable Ring Oscillator for Characterization of Static and Dynamic Variations,” in International Conference on Solid State Devices and Materials, September 2013, pp. 132-133. [C_Islam_SSDM_2013]
  46. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “On-Chip Detection of Process Shift and Process Spread for Silicon Debugging and Model-Hardware Correlation,” in IEEE Asian Test Symposium, 2012, pp. 350-354. [C_Islam_ATS_2012]
  47. A.K.M Mahfuzul Islam, Norihiro Kamae, Tohru Ishihara, and Hidetoshi Onodera, “A Built-in Self-adjustment Scheme with Adaptive Body Bias using P/N-sensitive Digital Monitor Circuits,” in IEEE Asian Solid-State Circuits Conference, November 2012, pp. 101-104. [C_Islam_A-SSCC_2012]
  48. Shuuichi Fujimoto, A.K.M. Mahfuzul Islam, Takashi Matsumoto, and Hidetoshi Onodera, “Inhomogeneous Ring Oscillator for WID Variability and RTN Characterization,” in IEEE International Conference on Microelectronic Test Structures, March 2012, pp. 25-30. (Best paper nominee) (Invited to IEEE-TSM special edition) [C_Fujimoto_ICMTS_2012]
  49. A.K.M. Mahfuzul Islam, Akira Tsuchiya, Kazutoshi Kobayashi, and Hidetoshi Onodera, “Variation-sensitive Monitor Circuits for Estimation of Die-to-Die Process Variation,” in IEEE International Conference on Microelectronic Test Structures, April 2011, pp. 153-157. (Invited to IEEE-TSM special edition) [C_Islam_ICMTS_2011]
  50. Shuuichi Fujimoto, A.K.M. Mahfuzul Islam, Shinichi Nishizawa, and Hidetoshi Onodera, “Component Analysis of WID Variation,” in IEEE International Workshop on Design for Manufacturability & Yield, May 2010. [C_Fujimoto_DFMY_2010]
  51. A.K.M. Mahfuzul Islam, Akira Tsuchiya, Kazutoshi Kobayashi, and Hidetoshi Onodera, “Process-sensitive Monitor Circuits for Estimation of Die-to-Die Process Variability,” in ACM International Workshop on Timing Issues in the Specification and Synthesis of Digital Systems, March 2010, pp. 83-88.

Patents

  1. Mahfuzul Islam, Takashi Hisakado, and Osami Wada, “Analog device, method for controlling same, temperature sensor, and analog-element-associated system,” International publication number: 2022180671. [link]
  2. Onodera, Hidetoshi, and Islam AKM Mahfuzul, “Reconfigurable delay circuit, delay monitor circuit using said delay circuit, variation compensation circuit, variation measurement method, and variation compensation method.” Publication No. US2016/0211836 A1.
  3. A.K.M. Mahfuzul Islam, and Hidetoshi Onodera, “Delay Circuits for Delay Monitor Circuits and Delay Monitor Circuits for signal-propagation-time measurements in integrated circuits,” Japan Patent number: 6297575.